Meet Us at IMS2023
IEEE MTT-S IMS2023 is less than 6 weeks away! COME VISIT OUR BOOTH #649 AT IMS2023 the flagship event in a week dedicated to all things microwaves and RF. The Largest event for RF and Microwave Professionals featuring 535+ Exhibitors will be packed with learning, networking, and fun!
1st SPACE MICROWAVE WEEK
Focus Microwaves is pleased to be a Gold-sponsor of the 1st edition of Space Microwave Week organized by the European Space Agency – ESA. Please contact us to get insights to our latest mmW & sub THZ vector loadpull and Noise parameter extraction solutions. With Space Microwave Week, scientists, engineers,
Keysight inaugurates a Semiconductor design and test lab in Beijing, China
Keysight partners with Focus Microwaves and Form Factor to exhibit a broad band noise parameter extraction solution from 2GHz -50GHz in their lab. The system includes industry’s most broadband tuner C5020B seamlessly integrated onto Form Factor’s Summit 200 wafer probe station together with broad band Focus Noise modules and a
Focus filed a US patent application on “INTEGRATED TERA-HERTZ SLIDE SCREW TUNER”
ABSTRACT A waveguide low profile slide-screw impedance tuner, for high tuning range (GAMMA) and seamless on-wafer integration, uses spring-loaded control of gold-plated alumina (Al2O3) tuning probe, controlling amplitude and phase of the reflection factor using miniature high precision piezo-electric actuators. This ensures the highest possible passive reflection factor GAMMA at
BSW Test Systems & Consulting joins FOCUS
bsw Test Systems & Consulting has more than 20yrs experience as a measurement solution provider for the semiconductor, electronic and telecom industry as well as research and development institutes. Our emphasis is on RF/µw techniques and high-speed digital, more specific on S-parameters, tuner measurement techniques for noise parameters and load-pull, Signal Integrity applications,
Keysight Technologies, Solution Partner
Keysight BrochureNon-Linear Measurements using PNA-X Focus Microwaves becomes a Keysight Technologies Solutions Partner MONTREAL, QC, Tuesday January 8th 2019 Today, Focus Microwaves and Keysight Technologies announced a strategic partnership to provide advanced load pull and noise measurement capabilities for a variety of applications and markets. The companies will collaborate to
Innovation Award at Edicon China 2018
Focus Microwaves is proud to announce that our breakthrough product, the MPT-110200 Multi-Harmonic Tuner, from 20 to 110GHz, has been selected as the winner in the Test & Measurement Category. A panel made up of Microwave Journal and Signal Integrity Journal editors and EDI CON advisory board members determined 15 finalists and selected the
2017 Accomplishments
MPT-110200 (Harmonic Tuner) Model MPT-110200 tunes independently three harmonic frequencies in the range 20-110GHz. Tuner performance is optimized at 28-56-84GHz (5G). Active modulated & harmonic tuning RAPID Focus Microwaves’ RAPID digital tuner is the heart of a precision, high-speed, load pull device characterization system for wideband modulated signals. The RAPID has been
EDICON China 2017
Visit Focus Microwaves Group to see our newest development – RAPID – integrated high speed load pull for wideband modulated signals – CM+ -The most advanced Behavior Cardiff Model, generated in record time – AU4850-1200V -Industry standard high voltage, 5kW pulser – CCMT+ -Millimeterwave mechanical tuner for on wafer |Gamma|=1. – 1808-MPT-SHP –High Power 0.8-18GHz 3 harmonic tunerDate: Tuesday, April 25, 2017 to Thursday,
New Patent: High Speed Hybrid Active Load Pull
ABSTRACT A high speed tuning and measuring algorithm is used for production level testing on-wafer a large number of chips. It applies to a hybrid active injection load pull test system. Using a pre-calibration of the passive tuner and the amplitude and phase settings of the active power injection signal
New Patent: High Power Slide Screw Tuners
ABSTRACT Impedance tuners used in high power measurements suffer fast heating and consequently thermal expansion of the center conductor, which has a very small mass and is thermally isolated from the environment and tuner housing. This leads to false measurements or catastrophic tuner failure (short) of either the DUT or
New Patent: Variable Capacitors for High Accuracy Tuning
ABSTRACT Improved interdigital parallel plate rotary capacitors to be used in automatic MHz range tuners have a grounding technique based on bronze sliding contact to effectively and continuously lead to the ground terminal the rotating comb-like blades of the capacitor and (optional) damping resistors inserted between the sliding contact and
New Patent: Wafer Probe Holder for Planarity and Orientation Adjustment
ABSTRACT A compact device allows individual or combined correction of wafer probe planarity and orientation misalignment. The device is made as a metallic block or as a strong plastic block and contains three sections, which are held together by a steel blade or by a steel blade and a rotation
New Patent: Method for Calibration and Tuning with Impedance Tuners
ABSTRACT An impedance synthesis method for single and multi-probe high resolution slide screw impedance RF and microwave tuners employs a fast calibration algorithm, which creates appropriately distributed calibration points over the Smith chart and a second order interpolation algorithm between calibration points, optimized for best suitability to the natural behavior
New Patent: Compact Two Probe Impedance Tuner
ABSTRACT An automated “double-decker” slide screw impedance tuner uses two tuning probes, independently movable inside two stacked circular slablines, which lie flat on the bench table. The eccentrically self-rotating disc probes are mounted at the end of rotating radial arm-carriages, the total mechanism operating in a planetary configuration. The radial
New Patent: Multi-band Low Frequency Impedance Tuner
ABSTRACT A multi-band, electro-mechanical programmable impedance tuner for the frequency range between 10 and 200 MHz uses cascades of three or more continuously variable mechanical capacitors interconnected with sets of low loss flexible or semi-rigid cables; for each frequency band a different set of cables and capacitors are used. The
New Patent: Compact Impedance Tuner
ABSTRACT // 14,751,544 A new slide screw impedance tuner structure uses a circular slabline, eccentrically rotating disc probes and a rotating carriage allowing reducing the linear size of the tuner by a factor of 3. The slabline lies flat on the bench table surface and the disc probe rotates at
New Patent: Coaxial Alignment Instrument Adapter
ABSTRACT An adapter alignment device, that can be added on the coaxial RF connectors of instruments, especially slide screw impedance tuners, aligns and guides precisely and repeat ably the male and female adapters into each-other. This leaves the internal center conductors of the tuner slabline, which are attached to the
Patent Issued: Hybrid Load Pull System and Method
ABSTRACT Fast tuning and measuring algorithms in open loop active load pull systems have been developed to accommodate high speed production testing of many chips of the same kind on wafer; they are based on re-setting the (pre-calibrated) amplitude and phase of the injected power into the device output port.
New Patent: Noise Parameter Measurement System
ABSTRACT A noise parameter test setup allows accurately measuring the four noise parameters (Fmin, Rn, Γopt) of microwave transistors over a wide frequency range using two wide-band directional couplers, instead of SPDT switches, to merge the s-parameter (signal) measurement path and the noise measurement path, avoiding thus the uncertainty of
Decision of Appeal Court on MPT Patent (US 7,135,941)
On September 14th, 2012 Maury Microwave challenged the validity of Focus’ US 7,135,941 patent (filed in May 2004, valid for 20 years). The patent claims a three carriage/three independent probe automatic tuner and the calibration method thereof, commercially also known as the MPT Technology. After a three and a half
Visit us at EDICON… Next to KEYSIGHT
Come see us at EDICON 2016 in Beijing, April 19-21 Our booth (409) is next to Keysight, Rohde&Schwarz and National Instruments 快来看看我们的展台在2016年EDICON (409)。 我们是站在旁边Keysight ,罗德与施瓦茨公司和美国国家仪器公司。
New Patent: Noise Parameter Extraction Method
ABSTRACT A wideband four noise parameter extraction method uses randomly distributed source states; the data are collected using wideband electro-mechanical tuners and noise and small signal receivers (network analyzers) in fast frequency sweeps; because of the random nature of source impedances reliable noise parameter values are extracted using selected source
New Patent: Low Frequency Coaxial Capacitors and Tuners
ABSTRACT A new type of variable coaxial, low frequency capacitor uses two cylindrical blocks, which are interdigitally insertable into each-other to create an adjustable capacitance. Each block is made using a conductive (aluminum, brass or copper) strip which is mounted vertically on a conductive basis and is wound in spiral