Our booth 439 will feature system demonstrations of our advanced microwave and RF solutions, including:
- 2-67GHz Broadband Noise Parameters Extraction Solution:
- Focus Microwaves’ 2-67GHz Noise parameter extraction solution, using the latest E29 option by Keysight, stands as the industry’s most broadband on-wafer solution.
- DLP – Dynamic Active Load Pull Solution:
- A versatile, all-in-one solution for CW and pulsed load-pull, S-Parameter, and DC IV characterization.
- RAPID VT – Wideband Active Load-Pull Solution:
- The Focus Microwaves RAPID VT digital tuner supports the latest 5G FR1 and IEEE 802.11ax standards, offering up to 1GHz active load-pull bandwidth capability.
- D-Band Noise Parameter Extraction:
- This cutting-edge solution enables precise on-wafer measurements of active circuits operating at millimeter-wave frequencies, particularly in the challenging D-Band spectrum.
- Tri-State Pulsed IV:
- Focus’ Tri-State Pulsed IV system is the industry’s only commercially available solution allowing for both isothermal and iso-dynamic state (constant trapping state) measurements characterization.
Visit us to explore these innovative solutions and more!
