This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.
ABSTRACT
A wideband four noise parameter extraction method uses randomly distributed source states; the data are collected using wideband electro-mechanical tuners and noise and small signal receivers (network analyzers) in fast frequency sweeps; because of the random nature of source impedances reliable noise parameter values are extracted using selected source admittance states. Multiple noise parameter extractions for all possible cross-combinations of source impedance states in each cluster at each measured frequency allows reliable and physically meaningful generation of wideband noise parameters, even for very low noise and potentially unstable DUT’s.
Filed: 3 April 2014
No: 14,244,439
Read more
Ruggedness
Pulsed IV Systems
Device Modeling
Strictly Necessary Cookie should be enabled at all times so that we can save your preferences for cookie settings.
If you disable this cookie, we will not be able to save your preferences. This means that every time you visit this website you will need to enable or disable cookies again.
This website uses Google Analytics to collect anonymous information such as the number of visitors to the site, and the most popular pages.
Keeping this cookie enabled helps us to improve our website.
Please enable Strictly Necessary Cookies first so that we can save your preferences!