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New Patent: Noise Parameter Extraction Method
ABSTRACT
A wideband four noise parameter extraction method uses randomly distributed source states; the data are collected using wideband electro-mechanical tuners and noise and small signal receivers (network analyzers) in fast frequency sweeps; because of the random nature of source impedances reliable noise parameter values are extracted using selected source admittance states. Multiple noise parameter extractions for all possible cross-combinations of source impedance states in each cluster at each measured frequency allows reliable and physically meaningful generation of wideband noise parameters, even for very low noise and potentially unstable DUT’s.
Filed: 3 April 2014
No: 14,244,439
