September 22, 2024
Meet us at EuMW2024
Our booth 303GB will feature system demonstrations of our advanced microwave and RF solutions, including: 1. DLP- One box Active Load-pull, Non-Linear Device characterization system ideal for all stages of characterization and testing, from initial development to final product testing. 2. Hybrid LP: Hybrid harmonic load pull (LP) demonstration featuring the latest four independent, phase-coherent sources from Keysight's Vector Network Analyzer (VNA) 3. Tri-State Pulsed IV: Not only ISO thermal, but you can keep your system ISO Dynamic by keeping the trapping state constant during your measurements. 4. D-Band characterization: A passive tuner based innovative/cutting edge solution for Vector LP, Hybrid LP and Noise Parameter Characterization solutions.