This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.
Features
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.
220 V
600 V
1200 V
2000 V
220 V
- Auriga PIV System – 220 V Configuration
- Typical Setup
If you would like to customize your system further, Email us at info@focus-microwaves.com
600 V
- Auriga PIV System – 600 V Configuration
- Typical Setup
If you would like to customize your system further, Email us at info@focus-microwaves.com
1200 V
- Auriga PIV System – 1200 V Configuration
- Typical Setup
If you would like to customize your system further, Email us at info@focus-microwaves.com
2000 V
- Auriga PIV System – 2000 V Configuration
- Typical Setup
If you would like to customize your system further, Email us at info@focus-microwaves.com
Request a quote
Please use this form to creating a quote.
"*" indicates required fields
