Product Brochures
Hybrid active Load Pull combines the benefits of both passive and active Load Pull techniques in one setup. Active Load Pull is the only method that allows reaching the low internal impedance of power transistors, especially on wafer and at very high frequencies.
Focus Microwaves manufactures wideband coaxial impedance tuners since 1989. For connectorized measurement applications, Focus has established a large portfolio of sub-18GHz tuners in fundamental (C) and harmonic (L for 2F0, M for 3F0) variations. All Focus coaxial tuners have between 1 and 9 wideband tuning probes, enabling the largest measurement bandwidths available on the market.
Focus Microwaves’ DELTA series of electro-mechanical tuners is designed specifically for high frequency on wafer measurements. The tuner’s low profile allows it to be placed within the wafer perimeter and allows for a direct connection between the probe tip and the tuner, eliminating all possible insertion loss between the DUT and the tuner. This revolutionary new tuner design enables the engineer to achieve optimum tuning range, with a tuner whose footprint and weight has been dramatically reduced.
Focus Microwaves pushes the boundaries of tuner technology once again. While 6G frequencies and applications are still being defined, Focus took the initiative and developed a new family of waveguide tuners designed for frequencies greater than 110GHz. Leveraging the success and technology of the DELTA tuners (industry standard for direct connect on wafer applications) and combined it with the micro-metric accuracy and repeatability of the small footprint OMEGA tuners. These new waveguide tuners revolutionize the Sub-THz bands.
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end pulse system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data.
Non-linear measurement data has been exploited in various ways to create behavioral models for high frequency
components. Formulations of these models have been
defined in terms of traveling waves, with a desire to represent nonlinear behavior of high frequency transistors
through a direct extension from linear s-parameters.
Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
Focus Microwaves’ noise parameter measurement system provides a solution to extract accurate noise parameters of a device under test (DUT): minimum noise figure, equivalent noise resistance and optimum noise reflection factor (Gamma and phase). The measurement system is designed to accommodate both connectorized and bare die devices, while offering fast, precise and stable measurements. The noise measurement system, along with its dedicated software (Requires option NPEx), is specifically optimized for the system calibration, DUT measurement, and DUT noise parameters extraction.
Auriga’s Bias Tees balance impressive RF performance with heavy-duty power handling across multiple frequency bands ranging from 100 MHz to 67 GHz. They are designed for rigorous usage without sacrificing RF performance. Only the highest-quality materials are used to minimize signal loss and enable efficient heat removal. These highest-power bias tees include a fast-acting fuse to protect DUTs against current spikes. A DC sense port is provided for accurately measuring the incident DC voltage. Models requiring external heat sinking include pre-tapped holes for easy mounting.
Focus Microwaves’ RAPID digital tuner technology is now available for very wideband communication signals, supporting the latest 5G FR1 and IEEE 802.11ax standards. This new architecture leverages the raw performance of National Instruments PXIe-5841* PXI Vector Signal Transceiver. The Rapid VT utilizes two PXIe-5841 VSTs to make a VNA architecture with up to 1GHz active load pull bandwidth capability. The system solution provides a flexible load pull test platform that can be used to test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax but can also be configured for fast load pull and s-parameter measurements.
The Load Pull Explorer (LPEx) is a load pull characterization and test software. Advanced software routines are used for tuner control/calibration, driver based instrument communication, and reference plane de-embedding. Standard frequency based, time domain based (vector-receiver based) measurements are supported. Additionally, hybrid active injection load pull allows the combination of active injection and passive tuning.
Hybrid active Load Pull combines the benefits of both passive and active Load Pull techniques in one setup. Active Load Pull is the only method that allows reaching the low internal impedance of power transistors, especially on wafer and at very high frequencies.
