Product Brochures
Hybrid active Load Pull combines the benefits of both passive and active Load Pull techniques in one setup. Active Load Pull is the only method that allows reaching the low internal impedance of power transistors, especially on wafer and at very high frequencies.
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end pulse system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data.
Since 1989 Focus Microwaves manufactures wideband coaxial programmable (slide screw) impedance tuners from 100MHz up to 110GHz. Focus’ fundamental tuners were designed with versatility in mind. The CCMT (Computer Controlled Microwave Tuner) family of tuners have one to three wideband probes enabling very wideband frequency coverage making it ideal for high power applications as well as wideband noise applications.
The MPT is Focus’ flagship tuner. Its performance is unmatched and its capabilities make it the most popular tuner on the market today. Multi-purpose tuners (MPT) use three wideband probes, allowing independent control of the amplitude and phase of the reflection factor at all three harmonic frequencies simultaneously.
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Focus Microwaves’ RAPID digital tuner is the heart of a
precision, high-speed, load pull device characterization
system. The RAPID has been developed by Focus’ UK
subsidiary MESURO and is suitable for every phase of the
design and production test cycle.
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The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end pulse system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data.
Read More
Non-linear measurement data has been exploited in various ways to create behavioral models for high frequency
components. Formulations of these models have been
defined in terms of traveling waves, with a desire to represent nonlinear behavior of high frequency transistors
through a direct extension from linear s-parameters.
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Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
The PHD1200 supports the industry’s most advanced high-powered devices. Leveraging recent breakthroughs in component and pulser-circuit technology provides unparalleled speed, accuracy, and resolution. Dynamic on-resistance of the latest transistors can now be measured with precision.
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Noise measurements allow the determination of the four Noise Parameters of a device (transistor).
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In an effort to provide complete measurement solutions to our customers, Focus Microwaves has developed, over time, customized accessories, which will make sure a load pull or noise test system will operate as expected.
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The Load Pull Explorer (LPEx) is a load pull characterization and test software. Advanced software routines are used for tuner control/calibration, driver based instrument communication, and reference plane de-embedding. Standard frequency based, time domain based (vector-receiver based) measurements are supported. Additionally, hybrid active injection load pull allows the combination of active injection and passive tuning.
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Hybrid active Load Pull combines the benefits of both passive and active Load Pull techniques in one setup. Active Load Pull is the only method that allows reaching the low internal impedance of power transistors, especially on wafer and at very high frequencies.