Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Introducing Auriga MEM™
Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.
Key Features :
– Provides extraordinary current resolution of 0.01% of max current.
– Provides temperature independent measurements, allowing for accurate measurements impervious to environmental temperature changes.
– Maintains calibration integrity for a longer period of time.
These key features enable the AU-5 to achieve the measurement accuracy and repeatability needed for tomorrow’s demanding devices.