This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.
Symptoms / Solutions:
We can modify the BNC T adaptor by removing one of its center pin and connecting it with short, then we can make the common ground with Auriga pulser head and DUT (specially for on-wafer test using DC probe tip) as shown in Figure 1.
Figure 1
Figure 2 and 3 shows one pin of the BNC T adaptors is removed.
Figure 2
Figure 3
Figure 4 shows how to connect the modified BNC T adaptor with pulser head to make common ground.
Figure 4
Keywords: Auriga, On-Wafer, DC probe, Common ground, BNC
Last date modified: April 3, 2017
Ruggedness
Pulsed IV Systems
Device Modeling
Privacy Overview
Strictly Necessary Cookies
Strictly Necessary Cookie should be enabled at all times so that we can save your preferences for cookie settings.
If you disable this cookie, we will not be able to save your preferences. This means that every time you visit this website you will need to enable or disable cookies again.
3rd Party Cookies
This website uses Google Analytics to collect anonymous information such as the number of visitors to the site, and the most popular pages.
Keeping this cookie enabled helps us to improve our website.
Please enable Strictly Necessary Cookies first so that we can save your preferences!