Auriga AU-5

Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

 

View our list of High Power Bias Tee’s to compliment your Pulsed Test System. 

Focus Microwaves Auriga Pulse IV mainframe system

Select a voltage so we can find the right system for you!

  • Tab Title
  • 220 V
  • 600 V
  • 1200 V
  • 2000 V

Auriga PIV System - 220 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

AU5-Product-Brochure_Auriga_2018-Updated-1

Auriga 220V configuration

wdt_ID Model Description

If you would like to customize your system further, Email us at info@focus-microwaves.com

Auriga PIV System - 600 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

Auriga 600V configuration

wdt_ID Model Description

If you would like to customize your system further, Email us at info@focus-microwaves.com

Auriga PIV System - 1200 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

Auriga 1200V configuration

wdt_ID Model Description

If you would like to customize your system further, Email us at info@focus-microwaves.com

Auriga PIV System - 2000 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

Auriga 2000V configuration

wdt_ID Model Description

If you would like to customize your system further, Email us at info@focus-microwaves.com