Our booth 303GB will feature system demonstrations of our advanced microwave and RF solutions, including:
1. DLP- One box Active Load-pull, Non-Linear Device characterization system ideal for all stages of characterization and testing, from initial development to final product testing.
2. Hybrid LP: Hybrid harmonic load pull (LP) demonstration featuring the latest four independent, phase-coherent sources from Keysight’s Vector Network Analyzer (VNA)
3. Tri-State Pulsed IV: Not only ISO thermal, but you can keep your system ISO Dynamic by keeping the trapping state constant during your measurements.
4. D-Band characterization: A passive tuner based innovative/cutting edge solution for Vector LP, Hybrid LP and Noise Parameter Characterization solutions.
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Ruggedness
Pulsed IV Systems
Device Modeling
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