FDCS (Focus Device Characterization Suite)
Includes everything a test engineer needs to fully characterize his transistors from 10MHz to 110GHz in power and noise.
- Beyond traditional Noise and Harmonic Load/Source Pull, FDCS also supports Tuner and Fixture (TRL) calibrations, Time Domain Load Line acquisition, Pulsed IV and Load Pull and Active feedback Power Injection operations (for Γ ≥ 1).
- The measured data are processed graphically into 2D and 3D plots and are converted into popular simulator formats (ADS, AWR etc.).
- The FDCS user unterface includes many many improvements and optimizations to make load pull and noise measurement easier.
- The software has ActiveX control for controlling MPT tuners in any ActiveX compatible platform.
FDCS Contour Overlay
FDCS Noise Measurements – Wideband Noise Parameter Display
FDCS S-Parameter Display
AURIGA Software Platform for Pulsed-IV Measurements
RAPID Mesuro’s Active Load Pull Software – Calibration