Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Introducing Auriga MEM™

Select a voltage so we can find the right system for you!

  • Tab Title
  • 220 V
  • 600 V
  • 1200 V
  • 2000 V

Auriga PIV System - 220 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

AU5-Product-Brochure_Auriga_2018-Updated-1

Auriga 220V configuration

wdt_ID Model Description
1 AU5 Pulsed IV/RF Characterization System
2 PHG20 Pulser Head, ±20 V, 100 mA, 2 W
3 PHD220-10 Pulser Head, 220 V, 10 A, 200 W
4 N5751A Power Supply to support 200 V Pulser Heads
5 AU5-RF (Optional) Pulsed RF Option

If you would like to customize your system further, Email us at info@focus-microwaves.com

Auriga PIV System - 600 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

Auriga 600V configuration

wdt_ID Model Description
1 AU5 Pulsed IV/RF Characterization System
2 PHG20 Pulser Head, ±20 V, 100 mA, 2 W
6 PHG100 Pulser Head, ±100 V, 2 A, 40 W
7 PHD600-5 Pulser Head, 600 V, 5 A, 1000 W
8 N5752A Power Supply to support 600 V Pulser Heads
9 AU5-RF (Optional) Pulsed RF Option

If you would like to customize your system further, Email us at info@focus-microwaves.com

Auriga PIV System - 1200 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

Auriga 1200V configuration

wdt_ID Model Description
1 AU5 Pulsed IV/RF Characterization System
6 PHG100 Pulser Head, ±100 V, 2 A, 40 W
7 PHD1200-100 Pulser Head, 1200 V, 100 A, 1000 W
10 PHD3000-HVK High-Voltage filter kit for 1200 V Pulser Head series
11 AU-3R100-LCU High Voltage Power Supply to support 1200 V Pulser Heads
12 AU5-RF (Optional) Pulsed RF Option

If you would like to customize your system further, Email us at info@focus-microwaves.com

Auriga PIV System - 2000 V Configuration

 

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.

Auriga 2000V configuration

wdt_ID Model Description
1 AU5 Pulsed IV/RF Characterization System
6 PHG100 Pulser Head, ±100 V, 2 A, 40 W
7 PHD2000-100 Pulser Head, 2000 V, 100 A, 1000 W
10 PHD3000-HVK High-Voltage filter kit for 2000 V Pulser Head series
11 AU-3R100-LCU High Voltage Power Supply to support 2000 V Pulser Heads
12 AU5-RF (Optional) Pulsed RF Option

If you would like to customize your system further, Email us at info@focus-microwaves.com

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