Load Pull tuning pattern and probe movement algorithms allow creating a test pattern allowing to avoid instability regions and spurious oscillations of microwave transistors during testing using slide screw load and source tuners. The impedances are selected based on the stability circle and instability area on the Smith chart and the probe movement trajectory allows both avoiding the static and circumventing the transient crossing through the instability area. All tuning commands are saved in a pattern file.
Stable Load Pull Operation Using Tuners / 15/091,165
Tuesday, April 5, 2016