Noise Parameter Measurement System / 9,541,592

Number: 
9,541,592
Date: 
Tuesday, January 10, 2017
Abstract: 

A noise parameter test setup yields accurate four noise parameters (Fmin, Rn, Γopt) of microwave transistors over a wide frequency range by merging the s-parameter (signal) measurement path and the noise measurement path, avoiding the RF switches and improving the measurement accuracy. Calibration of the system uses TRL and a similar concept as prior art solutions. Additional power control precautions of the VNA sources are necessary to avoid injecting large signal power into the sensitive noise receiver during s-parameter measurements and jamming the weak noise power during noise measurement.