NEW PATENT: Noise Parameter Measurement System and Method

A wideband four noise parameter measurement system and method uses electro-mechanical wideband tuners and fast noise and small signal receivers (network analyzers) to collect noise data in fast frequency sweeps over a large number of randomly distributed source tuner states; because of the random nature of source impedances, additional monitoring equipment allow evaluating critical device parameters in view of output mismatch and instabilities in order to validate the measured data. Multiple noise parameter extractions for all possible cross-combinations of source impedance states at each measured frequency allows reliable and physically meaningful generation of wideband noise parameters, even for very low noise and potentially unstable DUT's.

Filed 5/8/2011

Allowed 11/3/2014