Efficient Noise Extraction Algorithm and Wideband Noise Measurement System from 0.3 GHz to 67 GHz
Hoang V. Nguyen, Neven Misljenovic, and Bryan Hosein
An efficient and accurate noise parameter statistical extraction algorithm is proposed and validated experimentally using a high performance Silicon MOSFET transistor. The proposed algorithm is applicable to most devices with high input reflection coefficients and operating over wide bandwidth. Measured data agree well with theoretical expectation.
Noise parameter extraction, noise figure measurement, tuner, PNA-X.
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